Description

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This book provides a comprehensive assessment of the state of the art in nondestructive and destructive XRF analysis. With authors from both academia and industry, the coverage is wide ranging including details on applications and how specific analysis are done. The general introductory chapters are very important for informing worldwide users of this technology and how powerful it is. Chapters on mapping and core analysis will go beyond the species of XRF and venture into analytics. Aimed at graduates and postgraduates using this instrumentation who require accessible background information in order to develop quality analysis. It will go beyond appealing to traditional uses (art conservation and archaeology) of this technique to new fields where adoption is moving quickly.