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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering #29) (Paperback)

Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering #29) Cover Image
By Lawrence E. Murr (Editor)
$79.95
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Product Details
ISBN: 9780367402945
ISBN-10: 0367402947
Publisher: CRC Press
Publication Date: October 29th, 2019
Pages: 856
Language: English
Series: Optical Science and Engineering
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