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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Hardcover)

Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces Cover Image
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Description


This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.

Product Details
ISBN: 9780195092042
ISBN-10: 019509204X
Publisher: Oxford University Press, USA
Publication Date: August 25th, 1994
Pages: 288
Language: English
Series: Oxford Series in Optical & Imaging Sciences